Declared uniform distribution model

Seeded tolerance sampling

Inputs

Nominal chain resultNNominal one-dimensional result before sampled contributor variation.

Contributor 1 uniform half-width±t₁User-declared symmetric uniform half-width; enter 0 only when unused.

Contributor 2 uniform half-width±t₂User-declared symmetric uniform half-width; enter 0 only when unused.

Contributor 3 uniform half-width±t₃User-declared symmetric uniform half-width; enter 0 only when unused.

Contributor 4 uniform half-width±t₄Optional visible contributor; enter 0 when unused.

Contributor 5 uniform half-width±t₅Optional visible contributor; enter 0 when unused.

Contributor 6 uniform half-width±t₆Optional visible contributor; enter 0 when unused.

Declared integer seedseed—Visible non-negative integer state for reproducible local pseudo-random draws; it does not represent a physical population.

Declared sample countnsamplesFinite number of local draws from 10 through 10,000; more draws do not validate the input model.

Results

Generated local samples

1,000

samples

Reproducibility seed

20,260,819

—

Generated sample mean

99.998

Generated sample standard deviation

0.065179

Generated sample minimum

99.828

Generated sample maximum

100.16

Generated 1st percentile

99.864

Generated 99th percentile

100.13

Declared worst-case envelope half-width

0.18

xi = N + Σ[(2ui−1)·ti], ui from visible seeded LCG · reported percentiles use nearest generated rank

A first-pass number, not a code check, certification, or approval. Read the method and its limits below. What this is and is not.

Calculation snapshot

Seeded tolerance sampling

Formula version 1.0.0

Conditions

Nominal chain result	100
Contributor 1 uniform half-width	0.10
Contributor 2 uniform half-width	0.05
Contributor 3 uniform half-width	0.03
Contributor 4 uniform half-width	0
Contributor 5 uniform half-width	0
Contributor 6 uniform half-width	0
Declared integer seed	20260819
Declared sample count	1000

Calculated response

Generated local samples	1,000 samples
Reproducibility seed	20,260,819 —
Generated sample mean	99.998 mm
Generated sample standard deviation	0.065179 mm
Generated sample minimum	99.828 mm
Generated sample maximum	100.16 mm
Generated 1st percentile	99.864 mm
Generated 99th percentile	100.13 mm
Declared worst-case envelope half-width	0.18 mm

Method

xi = N + Σ[(2ui−1)·ti], ui from visible seeded LCG · reported percentiles use nearest generated rank

Source

Root-sum-square statistical tolerance stacking — standard result: https://enventive.com/tolerance-analysis-resources/worst-case-rss-and-monte-carlo-simulation-calculations-for-tolerance-analysis/

Boundaries

Linear one-dimensional additive stack
Uniform distribution selected by the user
Independent seeded pseudo-random draws
Visible integer seed and finite sample count

This printout is a record of displayed inputs and deterministic formula output. It is not an approval, certification, or engineering conclusion.

Nearby: ISO 286 fits · Tolerance stack · Position deviation · MMC bonus & virtual condition

Method

Formula, when it applies, and when it does not

Generate a reproducible local sample of a six-contributor linear stack using symmetric uniform half-widths, a visible seed, and a visible sample count.

xi = N + Σ[(2ui−1)·ti], ui from visible seeded LCG · reported percentiles use nearest generated rank

When

Linear one-dimensional additive stack
Uniform distribution selected by the user
Independent seeded pseudo-random draws
Visible integer seed and finite sample count

Don’t

This is a reproducible local pseudo-random sample of a user-declared independent uniform linear stack. It does not infer contributor distributions or independence, model geometry or assembly, estimate a physical population, predict yield, determine capability/compliance, recommend tolerances, or approve an assembly.

Root-sum-square statistical tolerance stacking — standard result